Controlled shift in emission wavelength from patterned porous silicon using focused ion beam irradiation

Controlled shift in emission wavelength from patterned porous silicon using focused ion beam irradiation

10.1149/1.2032347

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Bibliographic Details
Main Authors: Mangaiyarkarasi, D., Teo, E.J., Breese, M.B.H., Bettiol, A.A., Blackwood, D.J.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96093
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Institution: National University of Singapore
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Summary:10.1149/1.2032347

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