Defect processes in GaP: Implications for the behavior of excited surface defects

Defect processes in GaP: Implications for the behavior of excited surface defects

10.1103/PhysRevB.47.9346

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Bibliographic Details
Main Authors: Khoo, G.S., Ong, C.K.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96157
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Institution: National University of Singapore
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Summary:10.1103/PhysRevB.47.9346

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