Film thickness dependence of microwave surface resistance and microstructure in YBa2Cu3O7-δ thin films
10.1016/S0921-4534(00)01555-0
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Main Authors: | Wang, S.J., You, L.P., Ong, C.K., Zhang, X. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96632 |
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Institution: | National University of Singapore |
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