Film thickness dependence of microwave surface resistance and microstructure in YBa2Cu3O7-δ thin films

10.1016/S0921-4534(00)01555-0

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Bibliographic Details
Main Authors: Wang, S.J., You, L.P., Ong, C.K., Zhang, X.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96632
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Institution: National University of Singapore

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