Orientation control of epitaxial Ge thin films growth on SrTiO 3 (100) by ultrahigh vacuum sputtering

• Main Authors: Deng, W., Yang, M., Chai, J., Wong, T.I., Du, A., Ng, C.M., Feng, Y., Wang, S.
• Other Authors: PHYSICS
• Format: Article
• Published: 2014
• Subjects: Epitaxy; Ge/SrTiO 3; Transmission electron microscopy; X-ray diffraction; X-ray photoemission spectroscopy
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/97471
• Institution: National University of Singapore

10.1016/j.tsf.2012.03.037