The scanning microbeam PIXE analysis facility at NIRS

• Main Authors: Imaseki, H., Yukawa, M., Watt, F., Ishikawa, T., Iso, H., Hamano, T., Matsumoto, K., Yasuda, N.
• Other Authors: PHYSICS
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Elemental distribution; Mapping; Microbeam; Particle; PIXE
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/98930
• Institution: National University of Singapore

10.1016/S0168-583X(03)01002-4