Process quality monitoring at Altis Semiconductor

• Main Author: OTT, Holly
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2015
• Subjects: Operations; Quality Control; Semiconductor; Manufacturing; Problem Identification; Problem Containment; Investigation; Root Cause Analysis; Management Reporting; Statistical Process Control; Yield Analysis; Data Correlation; 8 Disciplines; Management Sciences and Quantitative Methods; Operations and Supply Chain Management
• Online Access: https://ink.library.smu.edu.sg/cases_coll_all/131; https://cmp.smu.edu.sg/case/2681
• Institution: Singapore Management University

Set in 2015, this case illustrates a typical process problem (or “excursion”) experienced in a production facility, considered from the perspective of the quality department. The case uses an example at Altis Semiconductor, where certain process parameters measured during production are indicating a...