Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale

The purpose of this research is to provide scholars with an instrument that helps capture the affective dimension in studies of technology. We conduct two studies that aim to build and validate a technology affect scale with desirable characteristics of reliability and validity, brevity and ease to...

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Main Author:	Perlusz, Stefano
Format:	text
Language:	English
Published:	Institutional Knowledge at Singapore Management University 2004
Subjects:	Business Administration, Management, and Operations Technology and Innovation
Online Access:	https://ink.library.smu.edu.sg/lkcsb_research_smu/34 https://ink.library.smu.edu.sg/cgi/viewcontent.cgi?article=1033&context=lkcsb_research_smu
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Institution:	Singapore Management University
Language:	English

id	sg-smu-ink.lkcsb_research_smu-1033
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spelling	sg-smu-ink.lkcsb_research_smu-10332018-07-10T06:22:51Z Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale Perlusz, Stefano The purpose of this research is to provide scholars with an instrument that helps capture the affective dimension in studies of technology. We conduct two studies that aim to build and validate a technology affect scale with desirable characteristics of reliability and validity, brevity and ease to administer. We make use of two theoretical dimensions of affect, positive affect (PA) and negative affect (NA), and provide preliminary analysis of their relevance by relating them to several constructs that have been deployed in prominent models of technology acceptance. 2004-10-01T07:00:00Z text application/pdf https://ink.library.smu.edu.sg/lkcsb_research_smu/34 https://ink.library.smu.edu.sg/cgi/viewcontent.cgi?article=1033&context=lkcsb_research_smu http://creativecommons.org/licenses/by-nc-nd/4.0/ Research Collection Lee Kong Chian School Of Business (SMU Access Only) eng Institutional Knowledge at Singapore Management University Business Administration, Management, and Operations Technology and Innovation
institution	Singapore Management University
building	SMU Libraries
country	Singapore
collection	InK@SMU
language	English
topic	Business Administration, Management, and Operations Technology and Innovation
spellingShingle	Business Administration, Management, and Operations Technology and Innovation Perlusz, Stefano Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale
description	The purpose of this research is to provide scholars with an instrument that helps capture the affective dimension in studies of technology. We conduct two studies that aim to build and validate a technology affect scale with desirable characteristics of reliability and validity, brevity and ease to administer. We make use of two theoretical dimensions of affect, positive affect (PA) and negative affect (NA), and provide preliminary analysis of their relevance by relating them to several constructs that have been deployed in prominent models of technology acceptance.
format	text
author	Perlusz, Stefano
author_facet	Perlusz, Stefano
author_sort	Perlusz, Stefano
title	Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale
title_short	Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale
title_full	Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale
title_fullStr	Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale
title_full_unstemmed	Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale
title_sort	emotions and technology acceptance: development and validation of a technology affect scale
publisher	Institutional Knowledge at Singapore Management University
publishDate	2004
url	https://ink.library.smu.edu.sg/lkcsb_research_smu/34 https://ink.library.smu.edu.sg/cgi/viewcontent.cgi?article=1033&context=lkcsb_research_smu
_version_	1681132868828397568

Emotions and Technology Acceptance: Development and Validation of a Technology Affect Scale

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