Towards more precise coincidental correctness detection with Deep Semantic Learning

• Main Authors: XIE, Huan, LEI, Yan, YAN, Meng, LI, Shanshan, MAO, Xiaoguang, YU, Yue, LO, David
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2024
• Subjects: Coincidental correctness; Deep Semantic Learning; Fault localization; Feature extraction; Machine learning algorithms; Location awareness; Deep learning; Clustering algorithms; Prediction algorithms; Benchmark testing; Partitioning algorithms; Artificial Intelligence and Robotics
• Online Access: https://ink.library.smu.edu.sg/sis_research/9920
• Institution: Singapore Management University

Coincidental correctness (CC) is a situation during the execution of a test case, the buggy entity is executed, but the program behaves correctly as expected. Many automated fault localization (FL) techniques use runtime information to discover the underlying connection between the executed buggy en...