Distance metric learning from uncertain side information with application to automated photo tagging

• Main Authors: WU, Lei, HOI, Steven C. H., JIN, Rong, ZHU, Jianke, YU, Nenghai
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2009
• Subjects: automated photo tagging; distance metric learning; uncertain side information; Computer Sciences; Databases and Information Systems
• Online Access: https://ink.library.smu.edu.sg/sis_research/2369; https://ink.library.smu.edu.sg/context/sis_research/article/3369/viewcontent/p135_wu.pdf
• Institution: Singapore Management University

Automated photo tagging is essential to make massive unlabeled photos searchable by text search engines. Conventional image annotation approaches, though working reasonably well on small testbeds, are either computationally expensive or inaccurate when dealing with large-scale photo tagging. Recentl...