Active Semi-Supervised Defect Categorization

• Main Authors: THUNG, Ferdian, LE, Xuan-Bach D., David LO
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2015
• Subjects: active learning; clustering; defect categorization; semi supervised learning; support vector machine; Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/3095; https://ink.library.smu.edu.sg/context/sis_research/article/4095/viewcontent/icpc15_defect.pdf
• Institution: Singapore Management University

Defects are inseparable part of software development and evolution. To better comprehend problems affecting a software system, developers often store historical defects and these defects can be categorized into families. IBM proposes Orthogonal Defect Categorization (ODC) which include various class...