Revisiting supervised and unsupervised methods for effort-aware cross-project defect prediction

• Main Authors: NI, Chao, XIA, Xin, LO, David, CHEN, Xiang, GU, Qing
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2020
• Subjects: Defect prediction; supervised model; unsupervised model; cross-project; Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/5927; https://ink.library.smu.edu.sg/context/sis_research/article/6930/viewcontent/Revisiting_Supervised_Defect_2020_av.pdf
• Institution: Singapore Management University

Cross-project defect prediction (CPDP), aiming to apply defect prediction models built on source projects to a target project, has been an active research topic. A variety of supervised CPDP methods and some simple unsupervised CPDP methods have been proposed. In a recent study, Zhou et al. found th...