Achieving high MAP-coverage through pattern constraint reduction

• Main Authors: ZHAO, Yingquan, WANG, Zan, LIU, Shuang, SUN, Jun, CHEN, Junjie, CHEN, Xiang
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2023
• Subjects: Computer bugs; Concurrency bug detection; Concurrent computing; Constraint solving; Coverage criteria; Instruction sets; Message systems; Programming; Sun; Systematics; Thread-safe class; Numerical Analysis and Scientific Computing; Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/6940; https://ink.library.smu.edu.sg/context/sis_research/article/7943/viewcontent/PatternConstraint_av.pdf
• Institution: Singapore Management University

Testing multi-threaded programs is challenging due to the enormous space of thread interleavings. Recently, a code coverage criterion for multi-threaded programs called MAP-coverage has been proposed and shown to be effective for testing concurrent programs. Existing approaches for achieving high MA...