Deep just-in-time defect localization

• Main Authors: QIU, Fangcheng, GAO, Zhipeng, XIA, Xin, LO, David, GRUNDY, John, WANG, Xinyu
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2022
• Subjects: Databases and Information Systems; Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/7666; https://ink.library.smu.edu.sg/context/sis_research/article/8669/viewcontent/tse216.pdf
• Institution: Singapore Management University

During software development and maintenance, defect localization is an essential part of software quality assurance. Even though different techniques have been proposed for defect localization, i.e., information retrieval (IR)-based techniques and spectrum-based techniques, they can only work after...