Simple or complex? Together for a more accurate just-in-time defect predictor

• Main Authors: ZHOU, Xin, HAN, DongGyun, LO, David
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2022
• Subjects: Deep learning; Semantics; Predictive models; Feature extraction; Databases and Information Systems
• Online Access: https://ink.library.smu.edu.sg/sis_research/7691; https://ink.library.smu.edu.sg/context/sis_research/article/8694/viewcontent/3524610.3527910.pdf
• Institution: Singapore Management University

Just-In-Time (JIT) defect prediction aims to automatically predict whether a commit is defective or not, and has been widely studied in recent years. In general, most studies can be classified into two categories: 1) simple models using traditional machine learning classifiers with hand-crafted feat...