Robust test selection for deep neural networks

• Main Authors: SUN, Weifeng, YAN, Meng, LIU, Zhongxin, LO, David
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2023
• Subjects: Artificial neural networks; Data models; Deep learning testing; deep neural networks; Labeling; Neurons; Noise measurement; Task analysis; test selection; Testing; OS and Networks; Software Engineering; Theory and Algorithms
• Online Access: https://ink.library.smu.edu.sg/sis_research/8374; https://ink.library.smu.edu.sg/context/sis_research/article/9377/viewcontent/RobustTextSelectionDNN_av.pdf
• Institution: Singapore Management University

Deep Neural Networks (DNNs) have been widely used in various domains, such as computer vision and software engineering. Although many DNNs have been deployed to assist various tasks in the real world, similar to traditional software, they also suffer from defects that may lead to severe outcomes. DN...