Realized Variance and Microstructure Noise -- Comment

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Main Authors:	Phillips, Peter Charles Bonest, Yu, Jun
Format:	text
Language:	English
Published:	Institutional Knowledge at Singapore Management University 2006
Subjects:	Econometrics
Online Access:	https://ink.library.smu.edu.sg/soe_research/353
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Institution:	Singapore Management University
Language:	English

id	sg-smu-ink.soe_research-1352
record_format	dspace
spelling	sg-smu-ink.soe_research-13522010-09-23T05:48:03Z Realized Variance and Microstructure Noise -- Comment Phillips, Peter Charles Bonest Yu, Jun 2006-01-01T08:00:00Z text https://ink.library.smu.edu.sg/soe_research/353 Research Collection School Of Economics eng Institutional Knowledge at Singapore Management University Econometrics
institution	Singapore Management University
building	SMU Libraries
continent	Asia
country	Singapore Singapore
content_provider	SMU Libraries
collection	InK@SMU
language	English
topic	Econometrics
spellingShingle	Econometrics Phillips, Peter Charles Bonest Yu, Jun Realized Variance and Microstructure Noise -- Comment
format	text
author	Phillips, Peter Charles Bonest Yu, Jun
author_facet	Phillips, Peter Charles Bonest Yu, Jun
author_sort	Phillips, Peter Charles Bonest
title	Realized Variance and Microstructure Noise -- Comment
title_short	Realized Variance and Microstructure Noise -- Comment
title_full	Realized Variance and Microstructure Noise -- Comment
title_fullStr	Realized Variance and Microstructure Noise -- Comment
title_full_unstemmed	Realized Variance and Microstructure Noise -- Comment
title_sort	realized variance and microstructure noise -- comment
publisher	Institutional Knowledge at Singapore Management University
publishDate	2006
url	https://ink.library.smu.edu.sg/soe_research/353
_version_	1770569131991498752

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