Local powers of least-squares-based test for panel fractional Ornstein-Uhlenbeck process

Based on the least squares estimator, this paper proposes a novel method to test the sign of the persistence parameter in a panel fractional Ornstein-Uhlenbeck process with a known Hurst parameter H. Depending on H ∈ (1/2, 1), H = 1/2, or H ∈ (0, 1/2), three test statistics are considered. In the nu...

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Bibliographic Details
Main Authors: TANAKA, Katsuto, XIAO, Weilin, Jun YU
Format: text
Language:English
Published: Institutional Knowledge at Singapore Management University 2020
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Online Access:https://ink.library.smu.edu.sg/soe_research/2358
https://ink.library.smu.edu.sg/context/soe_research/article/3357/viewcontent/LSE_test_14_.pdf
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Institution: Singapore Management University
Language: English