Commissioning of new diagnostic devices at PITZ

• Main Authors: Malyutin D., Krasilnikov M., Meissner J., Stephan F., Vashchenko G., Kusoljariyakul K., Rimjaem S.
• Format: Conference or Workshop Item
• Published: 2015
• Online Access: http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84890031949&origin=inward; http://cmuir.cmu.ac.th/handle/6653943832/38711
• Institution: Chiang Mai University

The Photo Injector Test facility at DESY, Zeuthen site (PITZ) is the test stand of the electron source for the European X-ray Free Electron Laser (XFEL). The main goal of the facility is the detailed characterization of the electron bunch parameters produced by the RF photo-cathode gun. Characterization of the bunch longitudinal properties such as bunch length or longitudinal phase space earlier was done using a streak camera, which measures the Cherenkov light produced by electron bunches passing through aerogel radiators. Recently, a Transverse Deflecting Structure (TDS) and a Second High Energy Dispersive Arm (HEDA2) were installed in the PITZ beamline. They will enable time resolved measurements of the electron bunch with much better time resolution than the streak camera system. The first results of the commissioning of the HEDA2 section at PITZ are presented in this contribution. Copyright © 2012 by the respective authors.