Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique

© 2015 Elsevier Ltd and Techna Group S.r.l. In this work Pb0.91La0.09(Zr0.70Ti0.30)0.9775O3 PLZT (9/70/30) and Pb0.91La0.09(Zr0.65Ti0.35)0.9775O3 PLZT (9/65/35) ceramics were prepared at four different sintering temperatures by solid solution method. The samples were aged by keeping at room temperat...

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Main Authors: Somwan,S., Ngamjarurojana,A.
Format: Article
Published: Elsevier Limited 2015
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http://cmuir.cmu.ac.th/handle/6653943832/38897
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spelling th-cmuir.6653943832-388972015-06-16T07:54:32Z Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique Somwan,S. Ngamjarurojana,A. Surfaces, Coatings and Films Materials Chemistry Electronic, Optical and Magnetic Materials Ceramics and Composites Process Chemistry and Technology © 2015 Elsevier Ltd and Techna Group S.r.l. In this work Pb0.91La0.09(Zr0.70Ti0.30)0.9775O3 PLZT (9/70/30) and Pb0.91La0.09(Zr0.65Ti0.35)0.9775O3 PLZT (9/65/35) ceramics were prepared at four different sintering temperatures by solid solution method. The samples were aged by keeping at room temperature for 19 days. After the aging process, structural and electrical properties of the samples were studied using Modified Michelson Interferometer, LCR meter and X-ray diffraction. The effect of the Zr/Ti ratios on the dielectric and ferroelectric properties was also investigated. The aged PLZT (9/70/30) showed pinched P-E loop and remnant strain in rhombohedral phase, while PLZT (9/65/35) showed distort s-E shape implying non-180° domain in tetragonal phase. 2015-06-16T07:54:32Z 2015-06-16T07:54:32Z 2015-01-26 Article in Press 02728842 2-s2.0-84923629249 10.1016/j.ceramint.2015.02.076 http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84923629249&origin=inward http://cmuir.cmu.ac.th/handle/6653943832/38897 Elsevier Limited
institution Chiang Mai University
building Chiang Mai University Library
country Thailand
collection CMU Intellectual Repository
topic Surfaces, Coatings and Films
Materials Chemistry
Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
spellingShingle Surfaces, Coatings and Films
Materials Chemistry
Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Somwan,S.
Ngamjarurojana,A.
Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
description © 2015 Elsevier Ltd and Techna Group S.r.l. In this work Pb0.91La0.09(Zr0.70Ti0.30)0.9775O3 PLZT (9/70/30) and Pb0.91La0.09(Zr0.65Ti0.35)0.9775O3 PLZT (9/65/35) ceramics were prepared at four different sintering temperatures by solid solution method. The samples were aged by keeping at room temperature for 19 days. After the aging process, structural and electrical properties of the samples were studied using Modified Michelson Interferometer, LCR meter and X-ray diffraction. The effect of the Zr/Ti ratios on the dielectric and ferroelectric properties was also investigated. The aged PLZT (9/70/30) showed pinched P-E loop and remnant strain in rhombohedral phase, while PLZT (9/65/35) showed distort s-E shape implying non-180° domain in tetragonal phase.
format Article
author Somwan,S.
Ngamjarurojana,A.
author_facet Somwan,S.
Ngamjarurojana,A.
author_sort Somwan,S.
title Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
title_short Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
title_full Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
title_fullStr Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
title_full_unstemmed Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
title_sort study of aging behavior of 9/70/30 and 9/65/35 plzt by optical interferometric technique
publisher Elsevier Limited
publishDate 2015
url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84923629249&origin=inward
http://cmuir.cmu.ac.th/handle/6653943832/38897
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