Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break

© 2016 Elsevier B.V. Ultra-low-energy ion interaction with naked DNA has been an interesting research topic as it can reveal fundamentals involved in charged particle irradiation effect on life as well as biological evolution. This study was a detailed investigation on ultra-low-energy argon ion bom...

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Main Authors: Thopan P., Yu L., Tippawan U.
Format: Journal
Published: 2017
Online Access:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84979503495&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/41311
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Institution: Chiang Mai University
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spelling th-cmuir.6653943832-413112017-09-28T04:20:33Z Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break Thopan P. Yu L. Tippawan U. © 2016 Elsevier B.V. Ultra-low-energy ion interaction with naked DNA has been an interesting research topic as it can reveal fundamentals involved in charged particle irradiation effect on life as well as biological evolution. This study was a detailed investigation on ultra-low-energy argon ion bombardment effects on naked DNA. Argon ion beam was decelerated by a deceleration lens to ultra low energy ranging from about 1 keV down to a few tens of eV to bombard naked DNA plasmid pGFP to fluences of 1, 2 and 4 × 10 15  ions/cm 2 . After ion bombardment, gel electrophoresis analyzed changes in the DNA topological form. The result showed that the DNA form changed, including from original supercoiled to damaged relaxed and linear forms, certainly depending on the ion energy and fluence. The DNA form changes as functions of the ion energy and fluence were quantified. It was found that the critical Ar-ion beam conditions were the energy 750 eV to be the lowest with the fluence 2 × 10 15  ions/cm 2 which could induce the linear DNA form, indicating direct double strand breaks, a more severe damage of DNA which might lead to mutation. 2017-09-28T04:20:33Z 2017-09-28T04:20:33Z 2016-11-25 Journal 02578972 2-s2.0-84979503495 10.1016/j.surfcoat.2016.07.012 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84979503495&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/41311
institution Chiang Mai University
building Chiang Mai University Library
country Thailand
collection CMU Intellectual Repository
description © 2016 Elsevier B.V. Ultra-low-energy ion interaction with naked DNA has been an interesting research topic as it can reveal fundamentals involved in charged particle irradiation effect on life as well as biological evolution. This study was a detailed investigation on ultra-low-energy argon ion bombardment effects on naked DNA. Argon ion beam was decelerated by a deceleration lens to ultra low energy ranging from about 1 keV down to a few tens of eV to bombard naked DNA plasmid pGFP to fluences of 1, 2 and 4 × 10 15  ions/cm 2 . After ion bombardment, gel electrophoresis analyzed changes in the DNA topological form. The result showed that the DNA form changed, including from original supercoiled to damaged relaxed and linear forms, certainly depending on the ion energy and fluence. The DNA form changes as functions of the ion energy and fluence were quantified. It was found that the critical Ar-ion beam conditions were the energy 750 eV to be the lowest with the fluence 2 × 10 15  ions/cm 2 which could induce the linear DNA form, indicating direct double strand breaks, a more severe damage of DNA which might lead to mutation.
format Journal
author Thopan P.
Yu L.
Tippawan U.
spellingShingle Thopan P.
Yu L.
Tippawan U.
Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break
author_facet Thopan P.
Yu L.
Tippawan U.
author_sort Thopan P.
title Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break
title_short Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break
title_full Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break
title_fullStr Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break
title_full_unstemmed Critical low-energy Ar-ion beam conditions to induce direct DNA double strand break
title_sort critical low-energy ar-ion beam conditions to induce direct dna double strand break
publishDate 2017
url https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84979503495&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/41311
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