Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis
© 2016 Elsevier Ltd. Despite wide usage of electrogalvanized coatings in various applications, characterization studies on their micro/crystal structure, and the understanding of how they correspondingly affect the properties, such as corrosion, are rather limited. This is mainly attributed to some...
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th-cmuir.6653943832-417722017-09-28T04:23:19Z Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis Jantaping N. Banjongprasert C. Chairuangsri T. Patakham U. Boonyongmaneerat Y. © 2016 Elsevier Ltd. Despite wide usage of electrogalvanized coatings in various applications, characterization studies on their micro/crystal structure, and the understanding of how they correspondingly affect the properties, such as corrosion, are rather limited. This is mainly attributed to some difficulties in preparing and examining the zinc coating layers, owing to their intrinsically low corrosion resistance and refined nano-scaled crystallite size. This study aims to examine such challenges systematically and propose some mitigation strategies. Particularly, sample preparation processes, including surface finishing for metallography and sample thinning processes are explored. Furthermore, a range of electron microscopy techniques, including scanning electron microscopy (SEM), electron back scattered diffractometry (EBSD), and transmission electron microscopy (TEM) are investigated in relation to the achievable clarity of microstructural details of electrogalvanized coatings. 2017-09-28T04:23:19Z 2017-09-28T04:23:19Z 2016-07-01 Journal 09684328 2-s2.0-84966457222 10.1016/j.micron.2016.04.006 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84966457222&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/41772 |
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© 2016 Elsevier Ltd. Despite wide usage of electrogalvanized coatings in various applications, characterization studies on their micro/crystal structure, and the understanding of how they correspondingly affect the properties, such as corrosion, are rather limited. This is mainly attributed to some difficulties in preparing and examining the zinc coating layers, owing to their intrinsically low corrosion resistance and refined nano-scaled crystallite size. This study aims to examine such challenges systematically and propose some mitigation strategies. Particularly, sample preparation processes, including surface finishing for metallography and sample thinning processes are explored. Furthermore, a range of electron microscopy techniques, including scanning electron microscopy (SEM), electron back scattered diffractometry (EBSD), and transmission electron microscopy (TEM) are investigated in relation to the achievable clarity of microstructural details of electrogalvanized coatings. |
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Journal |
author |
Jantaping N. Banjongprasert C. Chairuangsri T. Patakham U. Boonyongmaneerat Y. |
spellingShingle |
Jantaping N. Banjongprasert C. Chairuangsri T. Patakham U. Boonyongmaneerat Y. Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
author_facet |
Jantaping N. Banjongprasert C. Chairuangsri T. Patakham U. Boonyongmaneerat Y. |
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Jantaping N. |
title |
Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
title_short |
Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
title_full |
Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
title_fullStr |
Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
title_full_unstemmed |
Challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
title_sort |
challenges and strategies of surface modification of electrogalvanized coatings for electron microscopy analysis |
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2017 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84966457222&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/41772 |
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