Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics
Ge doped (Bi0.5Na0.5)TiO3 ceramics, (Bi0.5Na0.5)Ti1-xGex O3 (BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can for...
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th-cmuir.6653943832-47522014-08-30T02:55:43Z Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics Khamman O. Ge doped (Bi0.5Na0.5)TiO3 ceramics, (Bi0.5Na0.5)Ti1-xGex O3 (BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form single perovskite phase with rhombohedral symmetry. The grain size and morphology of the ceramics were examined by SEM. The average grain size of the ceramics was found to decrease with increasing Ge content. The dielectric constant was measured as a function of both temperature and frequency. All samples exhibited a relaxor ferroelectric behavior. © 2014 Copyright Taylor and Francis Group, LLC. 2014-08-30T02:55:43Z 2014-08-30T02:55:43Z 2014 Article 00150193 10.1080/00150193.2013.849981 FEROA http://www.scopus.com/inward/record.url?eid=2-s2.0-84892886151&partnerID=40&md5=497796bca08ec633ec94b0236dfc810c http://cmuir.cmu.ac.th/handle/6653943832/4752 English |
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English |
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Ge doped (Bi0.5Na0.5)TiO3 ceramics, (Bi0.5Na0.5)Ti1-xGex O3 (BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form single perovskite phase with rhombohedral symmetry. The grain size and morphology of the ceramics were examined by SEM. The average grain size of the ceramics was found to decrease with increasing Ge content. The dielectric constant was measured as a function of both temperature and frequency. All samples exhibited a relaxor ferroelectric behavior. © 2014 Copyright Taylor and Francis Group, LLC. |
| format |
Article |
| author |
Khamman O. |
| spellingShingle |
Khamman O. Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
| author_facet |
Khamman O. |
| author_sort |
Khamman O. |
| title |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
| title_short |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
| title_full |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
| title_fullStr |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
| title_full_unstemmed |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
| title_sort |
phase formation and dielectric properties of ge doped (bi 0.5na0.5)tio3 ceramics |
| publishDate |
2014 |
| url |
http://www.scopus.com/inward/record.url?eid=2-s2.0-84892886151&partnerID=40&md5=497796bca08ec633ec94b0236dfc810c http://cmuir.cmu.ac.th/handle/6653943832/4752 |
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