The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics
Pb[(Zr1/2Ti1/2)0.7(Zn1/3Nb2/3)0.3]O3 (PZT-30PZN) powder was prepared using the columbite precursor method. The phase development of calcined powder precursors was analyzed by X-ray diffraction. Dielectric and ferroelectric properties of the as-sintered and annealed samples were measured and correlat...
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th-cmuir.6653943832-52162014-08-30T02:56:16Z The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics Vittayakorn N. Cann D.P. Rujijanagul G. Tunkasiri T. Pb[(Zr1/2Ti1/2)0.7(Zn1/3Nb2/3)0.3]O3 (PZT-30PZN) powder was prepared using the columbite precursor method. The phase development of calcined powder precursors was analyzed by X-ray diffraction. Dielectric and ferroelectric properties of the as-sintered and annealed samples were measured and correlated with microstructure. The morphology evolution was determined by a scanning electron microscopy (SEM) technique. The as-sintered ceramic exhibited weak relaxor-ferroelectric behavior, with a relatively low dielectric constant maximum measured at 1 kHz (Km@1 kHz) of 14 000. Annealing resulted in a transition to normal-ferroelectric-like behavior, a shift in the dielectric maximum temperature from 310C to 300C, and a dramatic increase of Km@1 kHz to a maximum value of 25 100 for the longer anneal. After thermal annealing at 900C for 1 week a strong enhancement of remanent polarization (Pr) was observed. 2014-08-30T02:56:16Z 2014-08-30T02:56:16Z 2007 Conference Paper 00150193 10.1080/00150190701196229 69904 FEROA http://www.scopus.com/inward/record.url?eid=2-s2.0-34547315699&partnerID=40&md5=e002193f72dc8a41410badb2f8d6d503 http://cmuir.cmu.ac.th/handle/6653943832/5216 English |
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Pb[(Zr1/2Ti1/2)0.7(Zn1/3Nb2/3)0.3]O3 (PZT-30PZN) powder was prepared using the columbite precursor method. The phase development of calcined powder precursors was analyzed by X-ray diffraction. Dielectric and ferroelectric properties of the as-sintered and annealed samples were measured and correlated with microstructure. The morphology evolution was determined by a scanning electron microscopy (SEM) technique. The as-sintered ceramic exhibited weak relaxor-ferroelectric behavior, with a relatively low dielectric constant maximum measured at 1 kHz (Km@1 kHz) of 14 000. Annealing resulted in a transition to normal-ferroelectric-like behavior, a shift in the dielectric maximum temperature from 310C to 300C, and a dramatic increase of Km@1 kHz to a maximum value of 25 100 for the longer anneal. After thermal annealing at 900C for 1 week a strong enhancement of remanent polarization (Pr) was observed. |
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Conference or Workshop Item |
author |
Vittayakorn N. Cann D.P. Rujijanagul G. Tunkasiri T. |
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Vittayakorn N. Cann D.P. Rujijanagul G. Tunkasiri T. The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics |
author_facet |
Vittayakorn N. Cann D.P. Rujijanagul G. Tunkasiri T. |
author_sort |
Vittayakorn N. |
title |
The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics |
title_short |
The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics |
title_full |
The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics |
title_fullStr |
The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics |
title_full_unstemmed |
The effect of post-sintering annealing induced extrinsic dielectric properties in PZT-PZN ceramics |
title_sort |
effect of post-sintering annealing induced extrinsic dielectric properties in pzt-pzn ceramics |
publishDate |
2014 |
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http://www.scopus.com/inward/record.url?eid=2-s2.0-34547315699&partnerID=40&md5=e002193f72dc8a41410badb2f8d6d503 http://cmuir.cmu.ac.th/handle/6653943832/5216 |
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