Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique
© 2015 Elsevier Ltd. and Techna Group S.r.l. All rights reserved. In this work Pb<inf>0.91</inf>La<inf>0.09</inf>(Zr<inf>0.70</inf>Ti<inf>0.30</inf>)<inf>0.9775</inf>O<inf>3</inf> PLZT (9/70/30) and Pb<inf>0.91</inf>...
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th-cmuir.6653943832-542572018-09-04T10:18:10Z Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique Siripong Somwan Athipong Ngamjarurojana Chemical Engineering Materials Science © 2015 Elsevier Ltd. and Techna Group S.r.l. All rights reserved. In this work Pb<inf>0.91</inf>La<inf>0.09</inf>(Zr<inf>0.70</inf>Ti<inf>0.30</inf>)<inf>0.9775</inf>O<inf>3</inf> PLZT (9/70/30) and Pb<inf>0.91</inf>La<inf>0.09</inf>(Zr<inf>0.65</inf>Ti<inf>0.35</inf>)<inf>0.9775</inf>O<inf>3</inf> PLZT (9/65/35) ceramics were prepared at four different sintering temperatures by solid solution method. The samples were aged by keeping at room temperature for 19 days. After the aging process, structural and electrical properties of the samples were studied using Modified Michelson Interferometer, LCR meter and X-ray diffraction. The effect of the Zr/Ti ratios on the dielectric and ferroelectric properties was also investigated. The aged PLZT (9/70/30) showed pinched P-E loop and remnant strain in rhombohedral phase, while PLZT (9/65/35) showed distort s-E shape implying non-180° domain in tetragonal phase. 2018-09-04T10:10:11Z 2018-09-04T10:10:11Z 2015-01-01 Journal 02728842 2-s2.0-84930415972 10.1016/j.ceramint.2015.02.076 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84930415972&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/54257 |
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Chemical Engineering Materials Science Siripong Somwan Athipong Ngamjarurojana Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique |
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© 2015 Elsevier Ltd. and Techna Group S.r.l. All rights reserved. In this work Pb<inf>0.91</inf>La<inf>0.09</inf>(Zr<inf>0.70</inf>Ti<inf>0.30</inf>)<inf>0.9775</inf>O<inf>3</inf> PLZT (9/70/30) and Pb<inf>0.91</inf>La<inf>0.09</inf>(Zr<inf>0.65</inf>Ti<inf>0.35</inf>)<inf>0.9775</inf>O<inf>3</inf> PLZT (9/65/35) ceramics were prepared at four different sintering temperatures by solid solution method. The samples were aged by keeping at room temperature for 19 days. After the aging process, structural and electrical properties of the samples were studied using Modified Michelson Interferometer, LCR meter and X-ray diffraction. The effect of the Zr/Ti ratios on the dielectric and ferroelectric properties was also investigated. The aged PLZT (9/70/30) showed pinched P-E loop and remnant strain in rhombohedral phase, while PLZT (9/65/35) showed distort s-E shape implying non-180° domain in tetragonal phase. |
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Siripong Somwan Athipong Ngamjarurojana |
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Siripong Somwan Athipong Ngamjarurojana |
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Siripong Somwan |
title |
Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique |
title_short |
Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique |
title_full |
Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique |
title_fullStr |
Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique |
title_full_unstemmed |
Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique |
title_sort |
study of aging behavior of 9/70/30 and 9/65/35 plzt by optical interferometric technique |
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2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84930415972&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/54257 |
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