Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method

© 2015 Elsevier B.V. Sb - Bi - Te ternary compounds, with ZT values (unitless figure of merit for semiconductor materials) as high as 1.28, have long been known as the best thermoelectric materials for use in thermoelectric cooling and power generation operated near room temperature. In this researc...

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Main Authors: Suparat Tongpeng, Thapanee Sarakonsri, Seiji Isoda, Mitsutaka Haruta, Hiroki Kurata, Chanchana Thanachayanont
Format: Journal
Published: 2018
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http://cmuir.cmu.ac.th/jspui/handle/6653943832/54594
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Institution: Chiang Mai University
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spelling th-cmuir.6653943832-545942018-09-04T10:25:32Z Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method Suparat Tongpeng Thapanee Sarakonsri Seiji Isoda Mitsutaka Haruta Hiroki Kurata Chanchana Thanachayanont Materials Science Physics and Astronomy © 2015 Elsevier B.V. Sb - Bi - Te ternary compounds, with ZT values (unitless figure of merit for semiconductor materials) as high as 1.28, have long been known as the best thermoelectric materials for use in thermoelectric cooling and power generation operated near room temperature. In this research, p-type Sb2-xBixTe3(x = 0, 0.2, 0.4, 0.6, 0.8, and 1.0) compounds were synthesized by sol-gel method using bismuth (III) acetate, antimony (III) acetate and tellurium dioxide as precursors. The mole ratio of metal precursor: solvent: organic solvent was 1:60:4. The obtained gels of Sb2-xBixTe3were annealed to complete the synthesis at 773 K for 2 h under nitrogen atmosphere. Sb2Te3, Sb1.6Bi0.4Te3, and SbBiTe3compounds were observed by X-ray Diffraction (XRD) as main phases in samples with x = 0-0.2, 0.4-0.6, and 0.8-1.0, respectively. An increase in the lattice parameter a suggested an expansion of unit cells, due to the substitution of Bi in Sb crystallographic positions. The morphology, as revealed by Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) images, is one of aligned hexagonal nanosheets, while the Selected Area Diffraction (SAD) patterns matched well with the phases characterized by XRD. 2018-09-04T10:17:28Z 2018-09-04T10:17:28Z 2015-11-01 Journal 02540584 2-s2.0-84959867538 10.1016/j.matchemphys.2015.10.039 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84959867538&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/54594
institution Chiang Mai University
building Chiang Mai University Library
country Thailand
collection CMU Intellectual Repository
topic Materials Science
Physics and Astronomy
spellingShingle Materials Science
Physics and Astronomy
Suparat Tongpeng
Thapanee Sarakonsri
Seiji Isoda
Mitsutaka Haruta
Hiroki Kurata
Chanchana Thanachayanont
Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
description © 2015 Elsevier B.V. Sb - Bi - Te ternary compounds, with ZT values (unitless figure of merit for semiconductor materials) as high as 1.28, have long been known as the best thermoelectric materials for use in thermoelectric cooling and power generation operated near room temperature. In this research, p-type Sb2-xBixTe3(x = 0, 0.2, 0.4, 0.6, 0.8, and 1.0) compounds were synthesized by sol-gel method using bismuth (III) acetate, antimony (III) acetate and tellurium dioxide as precursors. The mole ratio of metal precursor: solvent: organic solvent was 1:60:4. The obtained gels of Sb2-xBixTe3were annealed to complete the synthesis at 773 K for 2 h under nitrogen atmosphere. Sb2Te3, Sb1.6Bi0.4Te3, and SbBiTe3compounds were observed by X-ray Diffraction (XRD) as main phases in samples with x = 0-0.2, 0.4-0.6, and 0.8-1.0, respectively. An increase in the lattice parameter a suggested an expansion of unit cells, due to the substitution of Bi in Sb crystallographic positions. The morphology, as revealed by Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) images, is one of aligned hexagonal nanosheets, while the Selected Area Diffraction (SAD) patterns matched well with the phases characterized by XRD.
format Journal
author Suparat Tongpeng
Thapanee Sarakonsri
Seiji Isoda
Mitsutaka Haruta
Hiroki Kurata
Chanchana Thanachayanont
author_facet Suparat Tongpeng
Thapanee Sarakonsri
Seiji Isoda
Mitsutaka Haruta
Hiroki Kurata
Chanchana Thanachayanont
author_sort Suparat Tongpeng
title Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
title_short Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
title_full Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
title_fullStr Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
title_full_unstemmed Electron Microscopy investigation of Sb<inf>2-x</inf>Bi<inf>x</inf>Te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
title_sort electron microscopy investigation of sb<inf>2-x</inf>bi<inf>x</inf>te<inf>3</inf>hexagonal crystal structure growth prepared from sol-gel method
publishDate 2018
url https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84959867538&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/54594
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