Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression

© Quintessenz. All right reserved. Purpose: To evaluate the effect of a scrubbing technique with one-step self-etching adhesives on bond strengths and nanoleakage expression at the resin/dentin interface. Materials and Methods: Flat human dentin surfaces bonded with one of two mild self-etching adhe...

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Main Authors: Ornnicha Thanatvarakorn, Taweesak Prasansuttiporn, Masahiro Takahashi, Suppason Thittaweerat, Richard M. Foxton, Shizuko Ichinose, Junji Tagami, Masatoshi Nakajima
Format: Journal
Published: 2018
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http://cmuir.cmu.ac.th/jspui/handle/6653943832/56240
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spelling th-cmuir.6653943832-562402018-09-05T03:11:20Z Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression Ornnicha Thanatvarakorn Taweesak Prasansuttiporn Masahiro Takahashi Suppason Thittaweerat Richard M. Foxton Shizuko Ichinose Junji Tagami Masatoshi Nakajima Medicine © Quintessenz. All right reserved. Purpose: To evaluate the effect of a scrubbing technique with one-step self-etching adhesives on bond strengths and nanoleakage expression at the resin/dentin interface. Materials and Methods: Flat human dentin surfaces bonded with one of two mild self-etching adhesives, SE One (SE) or Scotchbond Universal (SU) applied either with scrubbing or without scrubbing technique, were prepared (n = 5). The microtensile bond strengths (μTBS), SE micrographs of morphological changes on treated dentin surfaces, and expression of nanoleakage along the bonded dentin interfaces as shown with TEM were evaluated. μTBS data were analyzed using two-way ANOVA and the post-hoc t-test at the significance level of 0.05. Results: The scrubbing technique had a significant positive effect on the μTBS of SU (p < 0.05), while it produced no significant difference for SE (p > 0.05). Morphological evaluation of the treated dentin surfaces demonstrated that SU with scrubbing showed the highest etching ability, followed by scrubbing SE > nonscrubbing SE > nonscrubbing SU. In the nonscrubbing groups, nanoleakage formation using SU exhibited a reticular pattern throughout the hybridized complex, whereas with SE, water-tree nanoleakage was only found in the adhesive layer at dentinal tubule orifices. The scrubbing groups of both adhesives did not exhibit any nanoleakage expression. Conclusion: Using a scrubbing technique when applying mild self-etching adhesives could improve resin monomer infiltration into dentin, chase water on adhesive surfaces, and facilitate smear layer removal. 2018-09-05T03:11:20Z 2018-09-05T03:11:20Z 2016-01-01 Journal 17579988 14615185 2-s2.0-84984908096 10.3290/j.jad.a36033 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84984908096&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/56240
institution Chiang Mai University
building Chiang Mai University Library
country Thailand
collection CMU Intellectual Repository
topic Medicine
spellingShingle Medicine
Ornnicha Thanatvarakorn
Taweesak Prasansuttiporn
Masahiro Takahashi
Suppason Thittaweerat
Richard M. Foxton
Shizuko Ichinose
Junji Tagami
Masatoshi Nakajima
Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
description © Quintessenz. All right reserved. Purpose: To evaluate the effect of a scrubbing technique with one-step self-etching adhesives on bond strengths and nanoleakage expression at the resin/dentin interface. Materials and Methods: Flat human dentin surfaces bonded with one of two mild self-etching adhesives, SE One (SE) or Scotchbond Universal (SU) applied either with scrubbing or without scrubbing technique, were prepared (n = 5). The microtensile bond strengths (μTBS), SE micrographs of morphological changes on treated dentin surfaces, and expression of nanoleakage along the bonded dentin interfaces as shown with TEM were evaluated. μTBS data were analyzed using two-way ANOVA and the post-hoc t-test at the significance level of 0.05. Results: The scrubbing technique had a significant positive effect on the μTBS of SU (p < 0.05), while it produced no significant difference for SE (p > 0.05). Morphological evaluation of the treated dentin surfaces demonstrated that SU with scrubbing showed the highest etching ability, followed by scrubbing SE > nonscrubbing SE > nonscrubbing SU. In the nonscrubbing groups, nanoleakage formation using SU exhibited a reticular pattern throughout the hybridized complex, whereas with SE, water-tree nanoleakage was only found in the adhesive layer at dentinal tubule orifices. The scrubbing groups of both adhesives did not exhibit any nanoleakage expression. Conclusion: Using a scrubbing technique when applying mild self-etching adhesives could improve resin monomer infiltration into dentin, chase water on adhesive surfaces, and facilitate smear layer removal.
format Journal
author Ornnicha Thanatvarakorn
Taweesak Prasansuttiporn
Masahiro Takahashi
Suppason Thittaweerat
Richard M. Foxton
Shizuko Ichinose
Junji Tagami
Masatoshi Nakajima
author_facet Ornnicha Thanatvarakorn
Taweesak Prasansuttiporn
Masahiro Takahashi
Suppason Thittaweerat
Richard M. Foxton
Shizuko Ichinose
Junji Tagami
Masatoshi Nakajima
author_sort Ornnicha Thanatvarakorn
title Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
title_short Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
title_full Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
title_fullStr Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
title_full_unstemmed Effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
title_sort effect of scrubbing technique with mild self-etching adhesives on dentin bond strengths and nanoleakage expression
publishDate 2018
url https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84984908096&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/56240
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