Preliminary application of tapered glass capillary microbeam in MeV-PIXE mapping of longan leaf for elemental concentration distribution analysis

• المؤلفون الرئيسيون: S. Natyanun, S. Unai, L. D. Yu, U. Tippawan, N. Pussadee
• التنسيق: وقائع المؤتمر
• منشور في: 2018
• الموضوعات: Physics and Astronomy
• الوصول للمادة أونلاين: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85034043641&origin=inward; http://cmuir.cmu.ac.th/jspui/handle/6653943832/57896
• المؤسسة: Chiang Mai University

© Published under licence by IOP Publishing Ltd. This study was aimed at understanding elemental concentration distribution in local longan leaf for how the plant was affected by the environment or agricultural operation. The analysis applied the MeV-microbeam particle induced X-ray emission (PIXE)...