Kamwanna, T., Pasaja, N., Yu, L. D., Vilaithong, T., Anders, A., & Singkarat, S. (2018). MeV-ion beam analysis of the interface between filtered cathodic arc-deposited a-carbon and single crystalline silicon.

Kamwanna, T., N. Pasaja, L. D. Yu, T. Vilaithong, A. Anders, و S. Singkarat. MeV-ion Beam Analysis of the Interface between Filtered Cathodic Arc-deposited A-carbon and Single Crystalline Silicon. 2018.

Kamwanna, T., et al. MeV-ion Beam Analysis of the Interface between Filtered Cathodic Arc-deposited A-carbon and Single Crystalline Silicon. 2018.