Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route
Lead zirconate titanate (PZT) films were fabricated on Pt(111)/Ti/SiO2/ Si(100) using the triol sol - gel method. The effect of the pre-heating temperature on the phase transformations, microstructures, electrical properties and ferroelectric properties of the PZT thin films was investigated. Random...
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th-cmuir.6653943832-611832018-09-10T04:10:25Z Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route S. Thountom M. Naksata T. Tunkasiri Materials Science Physics and Astronomy Lead zirconate titanate (PZT) films were fabricated on Pt(111)/Ti/SiO2/ Si(100) using the triol sol - gel method. The effect of the pre-heating temperature on the phase transformations, microstructures, electrical properties and ferroelectric properties of the PZT thin films was investigated. Randomly-oriented PZT thin films pre-heated at 400C for 10 min and annealed at 600C for 30 min showed well-defined ferroelectric hysteresis loops with a remanent polarization of 26.57 C cm-2 and a coercive field of 115.42 kV cm-1. The dielectric constant and dielectric loss of the PZT films were 621 and 0.0395, respectively. The microstructures of the thin films are dense, crack-free and homogeneous with fine grains about 15-20 nm in size. 2018-09-10T04:06:13Z 2018-09-10T04:06:13Z 2007-08-01 Journal 10290338 01411594 2-s2.0-34547295795 10.1080/01411590701325103 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34547295795&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61183 |
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Materials Science Physics and Astronomy S. Thountom M. Naksata T. Tunkasiri Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route |
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Lead zirconate titanate (PZT) films were fabricated on Pt(111)/Ti/SiO2/ Si(100) using the triol sol - gel method. The effect of the pre-heating temperature on the phase transformations, microstructures, electrical properties and ferroelectric properties of the PZT thin films was investigated. Randomly-oriented PZT thin films pre-heated at 400C for 10 min and annealed at 600C for 30 min showed well-defined ferroelectric hysteresis loops with a remanent polarization of 26.57 C cm-2 and a coercive field of 115.42 kV cm-1. The dielectric constant and dielectric loss of the PZT films were 621 and 0.0395, respectively. The microstructures of the thin films are dense, crack-free and homogeneous with fine grains about 15-20 nm in size. |
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S. Thountom M. Naksata T. Tunkasiri |
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S. Thountom M. Naksata T. Tunkasiri |
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S. Thountom |
title |
Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route |
title_short |
Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route |
title_full |
Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route |
title_fullStr |
Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route |
title_full_unstemmed |
Phase evolution and effect of pre-heating temperature on the characteristics of PZT thin films grown by using a triol sol - Gel route |
title_sort |
phase evolution and effect of pre-heating temperature on the characteristics of pzt thin films grown by using a triol sol - gel route |
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2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34547295795&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61183 |
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