Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system

Ceramics in the xPb(Zn1/3Nb2/3)O3-(1-x) Pb(Zr0.5Ti0.5)O3[xPZN-(1-x)PZT] solid solution system are expected to display excellent dielectric, piezoelectric, and ferroelectric properties in compositions close to the morphotropic phase boundary (MPB). The dielectric behavior of ceramics with x = 0.1-0.6...

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Main Authors: N. Vittayakorn, G. Rujijanagul, X. Tan, H. He, M. A. Marquardt, D. P. Cann
Format: Journal
Published: 2018
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http://cmuir.cmu.ac.th/jspui/handle/6653943832/61687
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spelling th-cmuir.6653943832-616872018-09-11T09:02:27Z Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system N. Vittayakorn G. Rujijanagul X. Tan H. He M. A. Marquardt D. P. Cann Engineering Materials Science Physics and Astronomy Ceramics in the xPb(Zn1/3Nb2/3)O3-(1-x) Pb(Zr0.5Ti0.5)O3[xPZN-(1-x)PZT] solid solution system are expected to display excellent dielectric, piezoelectric, and ferroelectric properties in compositions close to the morphotropic phase boundary (MPB). The dielectric behavior of ceramics with x = 0.1-0.6 has been characterized in order to identify the MPB compositions in this system. Combined with X-ray diffraction results, ferroelectric hysteresis measurements, and Raman reflectivity analysis, it was consistently shown that an MPB exists between x = 0.2 and x = 0.3 in this binary system. When x ≤ 0.2, the tetragonal phase dominates at ambient temperatures. In the range of x ≥ 0.3, the rhombohedral phase dominates. For this rhombohedral phase, electrical measurements reveal a profound frequency dispersion in the dielectric response when x ≥ 0.6, suggesting a transition from normal ferroelectric to relaxor ferroelectric between 0.5 ≥ x ≤ 0.6. Excellent piezoelectric properties were found in 0.3PZN-0.7PZT, the composition closest to the MPB with a rhombohedral structure. The results are summarized in a PZN-PZT binary phase diagram. © Springer Science + Business Media, Inc. 2006. 2018-09-11T08:57:05Z 2018-09-11T08:57:05Z 2006-03-01 Journal 15738663 13853449 2-s2.0-33646015076 10.1007/s10832-006-4927-2 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33646015076&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61687
institution Chiang Mai University
building Chiang Mai University Library
country Thailand
collection CMU Intellectual Repository
topic Engineering
Materials Science
Physics and Astronomy
spellingShingle Engineering
Materials Science
Physics and Astronomy
N. Vittayakorn
G. Rujijanagul
X. Tan
H. He
M. A. Marquardt
D. P. Cann
Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system
description Ceramics in the xPb(Zn1/3Nb2/3)O3-(1-x) Pb(Zr0.5Ti0.5)O3[xPZN-(1-x)PZT] solid solution system are expected to display excellent dielectric, piezoelectric, and ferroelectric properties in compositions close to the morphotropic phase boundary (MPB). The dielectric behavior of ceramics with x = 0.1-0.6 has been characterized in order to identify the MPB compositions in this system. Combined with X-ray diffraction results, ferroelectric hysteresis measurements, and Raman reflectivity analysis, it was consistently shown that an MPB exists between x = 0.2 and x = 0.3 in this binary system. When x ≤ 0.2, the tetragonal phase dominates at ambient temperatures. In the range of x ≥ 0.3, the rhombohedral phase dominates. For this rhombohedral phase, electrical measurements reveal a profound frequency dispersion in the dielectric response when x ≥ 0.6, suggesting a transition from normal ferroelectric to relaxor ferroelectric between 0.5 ≥ x ≤ 0.6. Excellent piezoelectric properties were found in 0.3PZN-0.7PZT, the composition closest to the MPB with a rhombohedral structure. The results are summarized in a PZN-PZT binary phase diagram. © Springer Science + Business Media, Inc. 2006.
format Journal
author N. Vittayakorn
G. Rujijanagul
X. Tan
H. He
M. A. Marquardt
D. P. Cann
author_facet N. Vittayakorn
G. Rujijanagul
X. Tan
H. He
M. A. Marquardt
D. P. Cann
author_sort N. Vittayakorn
title Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system
title_short Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system
title_full Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system
title_fullStr Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system
title_full_unstemmed Dielectric properties and morphotropic phase boundaries in the xPb(Zn<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-(1-x)Pb(Zr<inf>0.5</inf>Ti<inf>0.5</inf>O<inf>3</inf>pseudo-binary system
title_sort dielectric properties and morphotropic phase boundaries in the xpb(zn<inf>1/3</inf>nb<inf>2/3</inf>)o<inf>3</inf>-(1-x)pb(zr<inf>0.5</inf>ti<inf>0.5</inf>o<inf>3</inf>pseudo-binary system
publishDate 2018
url https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33646015076&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/61687
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