Optical property modification of ruby and sapphire by N-ion implantation
Effects of N-ion implantation on surface modification of synthetic single crystalline ruby (Cr-doped Al2O3) and sapphire (α-Al2O3) were studied. N ions at energy 120 keV were implanted to samples with doses ranging from 1×1016to 1×1018ions/cm2. Temperature studies ruled out the effect of ion-beam he...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Journal |
| Published: |
2018
|
| Subjects: | |
| Online Access: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=18244391203&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/62269 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Chiang Mai University |
| Summary: | Effects of N-ion implantation on surface modification of synthetic single crystalline ruby (Cr-doped Al2O3) and sapphire (α-Al2O3) were studied. N ions at energy 120 keV were implanted to samples with doses ranging from 1×1016to 1×1018ions/cm2. Temperature studies ruled out the effect of ion-beam heating and, therefore, the gemological modification was the direct result of the implanted ions and radiation damage. Optical measurements showed that the optical absorption of the ion-implanted ruby uniformly increased without observable characteristic changes in any wavelength bands, whereas for the high-dose ion-implanted sapphire, optical absorption in the short wavelength region became stronger. The refractive indices however showed the same decreasing trend in the higher dose ion-implanted samples for both types of crystals. N-ion implantation also caused blistering of the surface, as studied by scanning electron microscopy (SEM). The medium-dose (5×1017ions/cm2) ion-implanted surfaces started to show drastic blistering, and the high-dose (1×1018ions/cm2) ion implantation further resulted in amorphization of the ruby and sapphire surfaces. According to these data, the optical property changes are then attributed to the gem-material surface modification. © 2004 Elsevier B.V. All rights reserved. |
|---|