Deposition of TiC on γ-TiAl alloys by directly applying voltages
Two γ-TiAl alloys, Ti-47Al-2Nb-2Cr (MJ12) and Ti-47Al-2Nb-2Mn-0. 8TiB2 (MJ47), were pressed in C powder to form rods and carburized by directly applying electrical power through them at 274.3 ± 26.4 W, 80 A for MJ12 and at 293.4 ± 16.8 W, 80 A for MJ47 in Ar atmosphere. The alloys were analysed usin...
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th-cmuir.6653943832-622772018-09-11T09:28:26Z Deposition of TiC on γ-TiAl alloys by directly applying voltages Chatdanai Boonruang Titipun Thongtem Michael McNallan Somsorn Singkarat Somchai Thongtem Materials Science Physics and Astronomy Two γ-TiAl alloys, Ti-47Al-2Nb-2Cr (MJ12) and Ti-47Al-2Nb-2Mn-0. 8TiB2 (MJ47), were pressed in C powder to form rods and carburized by directly applying electrical power through them at 274.3 ± 26.4 W, 80 A for MJ12 and at 293.4 ± 16.8 W, 80 A for MJ47 in Ar atmosphere. The alloys were analysed using an x-ray diffractometer (XRD), a scanning electron microscope (SEM) equipped with an energy dispersive x-ray (EDX) analyser and a Rutherford backscattering spectrometer (RBS) incorporated with NUSDAN solfware. Knoop hardness and wear resistance were improved and found to be in accord with the analytical results. © 2005 Trans Tech Publications, Switzerland. 2018-09-11T09:24:57Z 2018-09-11T09:24:57Z 2005-01-01 Book Series 10120394 2-s2.0-24944450798 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=24944450798&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/62277 |
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Materials Science Physics and Astronomy Chatdanai Boonruang Titipun Thongtem Michael McNallan Somsorn Singkarat Somchai Thongtem Deposition of TiC on γ-TiAl alloys by directly applying voltages |
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Two γ-TiAl alloys, Ti-47Al-2Nb-2Cr (MJ12) and Ti-47Al-2Nb-2Mn-0. 8TiB2 (MJ47), were pressed in C powder to form rods and carburized by directly applying electrical power through them at 274.3 ± 26.4 W, 80 A for MJ12 and at 293.4 ± 16.8 W, 80 A for MJ47 in Ar atmosphere. The alloys were analysed using an x-ray diffractometer (XRD), a scanning electron microscope (SEM) equipped with an energy dispersive x-ray (EDX) analyser and a Rutherford backscattering spectrometer (RBS) incorporated with NUSDAN solfware. Knoop hardness and wear resistance were improved and found to be in accord with the analytical results. © 2005 Trans Tech Publications, Switzerland. |
format |
Book Series |
author |
Chatdanai Boonruang Titipun Thongtem Michael McNallan Somsorn Singkarat Somchai Thongtem |
author_facet |
Chatdanai Boonruang Titipun Thongtem Michael McNallan Somsorn Singkarat Somchai Thongtem |
author_sort |
Chatdanai Boonruang |
title |
Deposition of TiC on γ-TiAl alloys by directly applying voltages |
title_short |
Deposition of TiC on γ-TiAl alloys by directly applying voltages |
title_full |
Deposition of TiC on γ-TiAl alloys by directly applying voltages |
title_fullStr |
Deposition of TiC on γ-TiAl alloys by directly applying voltages |
title_full_unstemmed |
Deposition of TiC on γ-TiAl alloys by directly applying voltages |
title_sort |
deposition of tic on γ-tial alloys by directly applying voltages |
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2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=24944450798&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/62277 |
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