Preparation and characterization of rutile TiO 2 films

Rutile titanium dioxide TiO 2 films were prepared by calcination for 4 h at temperatures in the range 550-700°C. Their structure and crystalline nature were investigated by X-ray diffraction (XRD), selected area electron diffraction (SAED) and Raman spectroscopy. After film preparation at 700°C, rut...

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Bibliographic Details
Main Authors: Narksitipan S., Thongtem S.
Format: Article
Language:English
Published: 2014
Online Access:http://www.scopus.com/inward/record.url?eid=2-s2.0-84857945657&partnerID=40&md5=0ec8042cee0498b6a5d8a0ad2be08fa4
http://cmuir.cmu.ac.th/handle/6653943832/6827
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Institution: Chiang Mai University
Language: English
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Summary:Rutile titanium dioxide TiO 2 films were prepared by calcination for 4 h at temperatures in the range 550-700°C. Their structure and crystalline nature were investigated by X-ray diffraction (XRD), selected area electron diffraction (SAED) and Raman spectroscopy. After film preparation at 700°C, rutile TiO2 with a tetragonal structure was detected. Raman spectra displayed centered bands at 235, 440 and 603 cm -1, corresponding to the rutile structure of TiO 2. The intensity of rutile TiO 2 increased with an increase in the calcination temperatures. The Raman spectra agree very well with SAED patterns. In addition, the characterization of rutile films with (scanning electron microscopy) SEM and atomic force microscopy (AFM) showed a surface roughness and dense particles with an angular shape.