Fabrication and characterization of PZT/CuO thin film
Pb(Zr0.52Ti0.48)O3 or PZT thin films embedded with CuO nano-particles were successfully prepared by a hybrid sol-gel process. In this process, CuO (0, 0.1, 0.2, 0.3, 0.4, 0.5 and 1wt%) nanopowder was suspended in an organometallic solution of PZT, and then coated on platinised silicon substrates usi...
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th-cmuir.6653943832-72882014-08-30T03:51:47Z Fabrication and characterization of PZT/CuO thin film Sreesattabud T. Gibbons B.J. Watcharapasorn A. Naksata M. Jiansirisomboon S. Pb(Zr0.52Ti0.48)O3 or PZT thin films embedded with CuO nano-particles were successfully prepared by a hybrid sol-gel process. In this process, CuO (0, 0.1, 0.2, 0.3, 0.4, 0.5 and 1wt%) nanopowder was suspended in an organometallic solution of PZT, and then coated on platinised silicon substrates using a spin-coating technique. X-ray diffraction patterns showed a perovskite phase in all the films. The CuO particles were not detected in the film, but the small amount of second phase was present when CuO concentration was above 0.4 wt%. The addition of CuO nano-particles also affected the orientation of PZT films. The CuO nano-particles were generally found to reduce both dielectric and ferroelectric properties of PZT films. However, at 0.2 wt% CuO concentration, the film exhibited good ferroelectric properties which were comparable to those of pure PZT thin films. © 2013 Copyright Taylor and Francis Group, LLC. 2014-08-30T03:51:47Z 2014-08-30T03:51:47Z 2013 Article 10584587 10.1080/10584587.2013.852042 IFERE http://www.scopus.com/inward/record.url?eid=2-s2.0-84891604951&partnerID=40&md5=2f727b493996e23bfaf3e7aa7c0a98a5 http://cmuir.cmu.ac.th/handle/6653943832/7288 English |
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Pb(Zr0.52Ti0.48)O3 or PZT thin films embedded with CuO nano-particles were successfully prepared by a hybrid sol-gel process. In this process, CuO (0, 0.1, 0.2, 0.3, 0.4, 0.5 and 1wt%) nanopowder was suspended in an organometallic solution of PZT, and then coated on platinised silicon substrates using a spin-coating technique. X-ray diffraction patterns showed a perovskite phase in all the films. The CuO particles were not detected in the film, but the small amount of second phase was present when CuO concentration was above 0.4 wt%. The addition of CuO nano-particles also affected the orientation of PZT films. The CuO nano-particles were generally found to reduce both dielectric and ferroelectric properties of PZT films. However, at 0.2 wt% CuO concentration, the film exhibited good ferroelectric properties which were comparable to those of pure PZT thin films. © 2013 Copyright Taylor and Francis Group, LLC. |
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Article |
author |
Sreesattabud T. Gibbons B.J. Watcharapasorn A. Naksata M. Jiansirisomboon S. |
spellingShingle |
Sreesattabud T. Gibbons B.J. Watcharapasorn A. Naksata M. Jiansirisomboon S. Fabrication and characterization of PZT/CuO thin film |
author_facet |
Sreesattabud T. Gibbons B.J. Watcharapasorn A. Naksata M. Jiansirisomboon S. |
author_sort |
Sreesattabud T. |
title |
Fabrication and characterization of PZT/CuO thin film |
title_short |
Fabrication and characterization of PZT/CuO thin film |
title_full |
Fabrication and characterization of PZT/CuO thin film |
title_fullStr |
Fabrication and characterization of PZT/CuO thin film |
title_full_unstemmed |
Fabrication and characterization of PZT/CuO thin film |
title_sort |
fabrication and characterization of pzt/cuo thin film |
publishDate |
2014 |
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http://www.scopus.com/inward/record.url?eid=2-s2.0-84891604951&partnerID=40&md5=2f727b493996e23bfaf3e7aa7c0a98a5 http://cmuir.cmu.ac.th/handle/6653943832/7288 |
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