Dielectric aging of Cr-doped PZT ceramics
The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti 0.48)O3 were investigated. The composition of Pb(Zr0.52Ti0.48)O3 with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3 addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching...
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2014
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th-cmuir.6653943832-72912014-08-30T03:51:47Z Dielectric aging of Cr-doped PZT ceramics Ketsuwan P. Prasatkhetragarn A. Ngamjarurojana A. Ananta S. Yimnirun R. The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti 0.48)O3 were investigated. The composition of Pb(Zr0.52Ti0.48)O3 with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3 addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching from high temperatures above the Curie temperature. The dielectric aging of all compositions revealed relaxor aging behavior. The aging rate of stable stage obeyed a logarithmic time dependence, while the aging rate decreased with increasing Cr2O3 at low concentration (0.1-0.6). Further increase in Cr2O3 concentration, the aging rate turned to increase. © 2013 Copyright Taylor and Francis Group, LLC. 2014-08-30T03:51:47Z 2014-08-30T03:51:47Z 2013 Article 10584587 10.1080/07315171.2013.853561 IFERE http://www.scopus.com/inward/record.url?eid=2-s2.0-84891796229&partnerID=40&md5=86824c05cb64f7e1530f7b5de3e4fb88 http://cmuir.cmu.ac.th/handle/6653943832/7291 English |
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The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti 0.48)O3 were investigated. The composition of Pb(Zr0.52Ti0.48)O3 with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3 addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching from high temperatures above the Curie temperature. The dielectric aging of all compositions revealed relaxor aging behavior. The aging rate of stable stage obeyed a logarithmic time dependence, while the aging rate decreased with increasing Cr2O3 at low concentration (0.1-0.6). Further increase in Cr2O3 concentration, the aging rate turned to increase. © 2013 Copyright Taylor and Francis Group, LLC. |
| format |
Article |
| author |
Ketsuwan P. Prasatkhetragarn A. Ngamjarurojana A. Ananta S. Yimnirun R. |
| spellingShingle |
Ketsuwan P. Prasatkhetragarn A. Ngamjarurojana A. Ananta S. Yimnirun R. Dielectric aging of Cr-doped PZT ceramics |
| author_facet |
Ketsuwan P. Prasatkhetragarn A. Ngamjarurojana A. Ananta S. Yimnirun R. |
| author_sort |
Ketsuwan P. |
| title |
Dielectric aging of Cr-doped PZT ceramics |
| title_short |
Dielectric aging of Cr-doped PZT ceramics |
| title_full |
Dielectric aging of Cr-doped PZT ceramics |
| title_fullStr |
Dielectric aging of Cr-doped PZT ceramics |
| title_full_unstemmed |
Dielectric aging of Cr-doped PZT ceramics |
| title_sort |
dielectric aging of cr-doped pzt ceramics |
| publishDate |
2014 |
| url |
http://www.scopus.com/inward/record.url?eid=2-s2.0-84891796229&partnerID=40&md5=86824c05cb64f7e1530f7b5de3e4fb88 http://cmuir.cmu.ac.th/handle/6653943832/7291 |
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1681420772808065024 |