Force volume imaging of defects in highly drawn high-density polyethylene
The internal structure of highly drawn high-density polyethylene (HDPE) of various draw ratios was studied. An atomic force microscope (AFM) in force volume (FV) mode was used to reveal the difference in mechanical properties of different regions of the cut surface of the sample. It was found that d...
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th-mahidol.243562018-08-24T08:55:42Z Force volume imaging of defects in highly drawn high-density polyethylene Nattawut Chaiyut Taweechai Amornsakchai Sombat Thanawan Mahidol University The Institute of Science and Technology for Research and Development, Mahidol University Chemistry Materials Science The internal structure of highly drawn high-density polyethylene (HDPE) of various draw ratios was studied. An atomic force microscope (AFM) in force volume (FV) mode was used to reveal the difference in mechanical properties of different regions of the cut surface of the sample. It was found that different regions have very similar mechanical response to the tip of the microscope. The only observable difference that allows an image to be constructed is the tip-surface adhesion force of the retracting line. It was found that the areas which appear as entire bands under the scanning electron microscope (SEM) have much lower adhesion force than the areas in between those bands. A mechanism of defect formation based on the changes in mechanical response is proposed. © 2007 Elsevier Ltd. All rights reserved. 2018-08-24T01:46:50Z 2018-08-24T01:46:50Z 2007-05-01 Article Polymer Testing. Vol.26, No.3 (2007), 396-401 10.1016/j.polymertesting.2006.12.009 01429418 2-s2.0-34047143127 https://repository.li.mahidol.ac.th/handle/123456789/24356 Mahidol University SCOPUS https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34047143127&origin=inward |
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Chemistry Materials Science Nattawut Chaiyut Taweechai Amornsakchai Sombat Thanawan Force volume imaging of defects in highly drawn high-density polyethylene |
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The internal structure of highly drawn high-density polyethylene (HDPE) of various draw ratios was studied. An atomic force microscope (AFM) in force volume (FV) mode was used to reveal the difference in mechanical properties of different regions of the cut surface of the sample. It was found that different regions have very similar mechanical response to the tip of the microscope. The only observable difference that allows an image to be constructed is the tip-surface adhesion force of the retracting line. It was found that the areas which appear as entire bands under the scanning electron microscope (SEM) have much lower adhesion force than the areas in between those bands. A mechanism of defect formation based on the changes in mechanical response is proposed. © 2007 Elsevier Ltd. All rights reserved. |
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Mahidol University |
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Mahidol University Nattawut Chaiyut Taweechai Amornsakchai Sombat Thanawan |
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Article |
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Nattawut Chaiyut Taweechai Amornsakchai Sombat Thanawan |
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Nattawut Chaiyut |
title |
Force volume imaging of defects in highly drawn high-density polyethylene |
title_short |
Force volume imaging of defects in highly drawn high-density polyethylene |
title_full |
Force volume imaging of defects in highly drawn high-density polyethylene |
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Force volume imaging of defects in highly drawn high-density polyethylene |
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Force volume imaging of defects in highly drawn high-density polyethylene |
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force volume imaging of defects in highly drawn high-density polyethylene |
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2018 |
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https://repository.li.mahidol.ac.th/handle/123456789/24356 |
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