Review on policies, research & development in microelectronic industry in Malaysia

by Ahmad, I.B., Sulaiman, N.B.
Published 2017

Improved series resistance model for CMOS ESD diodes

by Kamal, N.B., Kordesch, A.V., Ahmad, I.B.
Published 2017

Improved series resistance model for CMOS ESD diodes

by Kamal N.B., Kordesch A.V., Ahmad I.B.
Published 2023

Effects of high-K dielectrics with metal gate for electrical characteristics of 18nm NMOS device

by Atan, N.B., Ahmad, I.B., Majlis, B.B.Y.
Published 2017

Effects of high-K dielectrics with metal gate for electrical characteristics of 18nm NMOS device

by Atan N.B., Ahmad I.B., Majlis B.B.Y.
Published 2023

Influence of optimization of control factors on threshold voltage of 18 nm HfO2/TiSi2 NMOS

by Atan, N.B., Majlis, B.B.Y., Ahmad, I.B., Chong, K.H.
Published 2020

Influence of optimization of control factors on threshold voltage of 18 nm HfO2/TiSi2 NMOS

by Atan N.B., Majlis B.B.Y., Ahmad I.B., Chong K.H.
Published 2023

The characterization of KrF photoresists and the effect of different chromophore bulkiness on line edge roughness (LER) for submicron technology

by Yusri, A., Bakri, M., Manaf, M.J., Wahab, K.I.A., Ahmad, I.B.
Published 2017

Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device

by Atan, N.B., Ahmad, I.B., Majlis, B.B.Y., Fauzi, I.B.A.
Published 2017

Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device

by Atan, N.B., Ahmad, I.B., Majlis, B.B.Y., Fauzi, I.B.A.
Published 2017

Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device

by Atan N.B., Ahmad I.B., Majlis B.B.Y., Fauzi I.B.A.
Published 2023

Polymer-based microfluidics with surface-enhanced Raman-spectroscopy-active periodic metal nanostructures for biofluid analysis

by Kho, K.W., Qing, K.Z.M., Shen, Z.X., Ahmad, I.B., Lim, S.S.C., Mhaisalkar, S., White, T.J., Watt, F., Soo, K.C., Olivo, M.
Published 2014