Evolution of hole trapping in the oxynitride gate p-MOSFET subjected to negative-bias temperature stressing

由 Boo, A. A., Ang, Diing Shenp
出版 2013

Negative-bias temperature instability – insight from recent dynamic stress experiments

由 Ang, Diing Shenp, Boo, A. A., Gao, Yuan
出版 2013

Correlation between oxide trap generation and negative-bias temperature instability

由 Boo, A. A., Teo, Z. Q., Leong, K. C., Ang, Diing Shenp
出版 2013

Are interface state generation and positive oxide charge trapping under negative-bias temperature stressing correlated or coupled?

由 Ho, T. J. J., Boo, A. A., Teo, Z. Q., Leong, K. C., Ang, Diing Shenp
出版 2013