Atomic scale modulation of self‐rectifying resistive switching by interfacial defects

由 Wu, Xing, Yu, Kaihao, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xixiang, Li, Kun, Liu, Qi, Sun, Litao, Pey, Kinleong
出版 2018

Intrinsic nanofilamentation in resistive switching

由 Migas, Dmitri B., Borisenko, Victor E., Wu, Xing, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xi Xiang, Li, Kun, Pey, Kin Leong
出版 2014

Effects of electrode material and configuration on the characteristics of planar resistive switching devices

由 Cha, Dongkyu, David, A., Li, K., Wu, T., Peng, H. Y., Pu, L., Wu, J. C., Hong, J. H., Lin, W. N., Li, Y. Y., Ding, J. F.
出版 2014