A framework to practical predictive maintenance modeling for multi-state systems

بواسطة Tan, Cher Ming, Raghavan, Nagarajan
منشور في 2013

Statistical modeling of via redundancy effects on interconnect reliability

بواسطة Tan, Cher Ming, Raghavan, Nagarajan
منشور في 2010

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

بواسطة Tan, Cher Ming, Raghavan, Nagarajan
منشور في 2010

Analysis of correlated gate and drain random telegraph noise in post-soft breakdownTiN/HfLaO/SiOx nMOSFETs

بواسطة Liu, Wenhu, Padovani, Andrea, Larcher, Luca, Raghavan, Nagarajan, Pey, Kin Leong
منشور في 2014

Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching

بواسطة Raghavan, Nagarajan, Pey, Kin Leong, Wu, Xing, Liu, Wenhu, Bosman, Michel
منشور في 2013

Comparative study of non-standard power diodes

بواسطة Tan, Cher Ming, Raghavan, Nagarajan, Sun, Lina, Hsu, Chuck, Wang, Chase
منشور في 2010

Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomena

بواسطة Pey, Kin Leong, Raghavan, Nagarajan, Wu, Xing, Liu, Wenhu, Bosman, Michel
منشور في 2013

A rapid design exploration framework under additive manufacturing process uncertainty

بواسطة Xiong, Yi, Duong, Pham Luu Trung, Raghavan, Nagarajan, Rosen, David W
منشور في 2018

Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications

بواسطة Liu, W. H., Pey, Kin Leong, Raghavan, Nagarajan, Wu, X., Bosman, Michel
منشور في 2013

Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks

بواسطة Raghavan, Nagarajan, Pey, Kin Leong, Shubhakar, K., Wu, X., Liu, W. H., Bosman, Michel
منشور في 2013

Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stress

بواسطة Raghavan, Nagarajan, Padovani, Andrea, Li, Xiang, Bosman, Michel, Wu, Xing, Lip Lo, Vui, Larcher, Luca, Leong Pey, Kin
منشور في 2013

Exploring the impact of variability in resistance distributions of RRAM on the prediction accuracy of deep learning neural networks

بواسطة Prabhu, Nagaraj Lakshmana, Loy, Desmond Jia Jun, Dananjaya, Putu Andhita, Lew, Wen Siang, Toh, Eng Huat, Raghavan, Nagarajan
منشور في 2021

Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

بواسطة Sahay, Rahul, Tu, Yen-Cheng, Aziz, Izzat, Budiman, Arief S., Tan, Cher Ming, Lee, Pooi See, Thomas, Olivier, Raghavan, Nagarajan
منشور في 2024

Atomic scale modulation of self‐rectifying resistive switching by interfacial defects

بواسطة Wu, Xing, Yu, Kaihao, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xixiang, Li, Kun, Liu, Qi, Sun, Litao, Pey, Kinleong
منشور في 2018

Intrinsic nanofilamentation in resistive switching

بواسطة Migas, Dmitri B., Borisenko, Victor E., Wu, Xing, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xi Xiang, Li, Kun, Pey, Kin Leong
منشور في 2014

Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

بواسطة Navarro, Etienne, Cornelius, Thomas W., Proudhon, Henry, Sahay, Rahul, Radchenko, Ihor, Escoubas, Stephanie, Lee, Pooi See, Raghavan, Nagarajan, Budiman, Arief S., Thomas, Olivier
منشور في 2023

Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM

بواسطة Shubhakar, K., Pey, Kin Leong, Bosman, Michel, Thamankar, R., Kushvaha, S. S., Loke, Y. C., Wang, Z. R., Raghavan, Nagarajan, Wu, X., O'Shea, S. J.
منشور في 2013