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by Dzelzainis, TWJ, Chalupsky, J, Fajardo, M, F??ustlin, R, Heimann, PA, Hajkova, V, Juha, L0, Jurek, M, Khattak, FY, Kozlova, M, Krzywinski, J, Lee, RW, Nagler, B, Nelson, AJ, Rosmej, FB, Soberierski, R, Toleikis, S, Tschentscher, T, Vinko, SM, Wark, JS, Whitcher, T, Riley, D
Published 2019
Get full textPublished 2019
Article
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XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2
by Rosmej, FB, Galtier, E, Riley, D, Dzelzainis, T, Heinmann, P, Khattak, FY, Lee, RW, Nagler, B, Nelson, A, Tschentscher, T, Vinko, SM, Whitcher, T, Toleikis, S, F??ustlin, R, Soberierski, R, Juha, L, Fajardo, M, Wark, JS, Chalupsky, J, Hajkova, V, Krzywinski, J, Jurek, M, Kozlova, M
Published 2019
Get full textPublished 2019
Article