XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2

10.1088/1742-6596/244/4/042028

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Bibliographic Details
Main Authors:	Rosmej, FB, Galtier, E, Riley, D, Dzelzainis, T, Heinmann, P, Khattak, FY, Lee, RW, Nagler, B, Nelson, A, Tschentscher, T, Vinko, SM, Whitcher, T, Toleikis, S, F??ustlin, R, Soberierski, R, Juha, L, Fajardo, M, Wark, JS, Chalupsky, J, Hajkova, V, Krzywinski, J, Jurek, M, Kozlova, M
Other Authors:	CENTRE FOR ADVANCED 2D MATERIALS
Format:	Article
Published:	IOP Publishing 2019
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/155151
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Institution:	National University of Singapore

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