XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2
10.1088/1742-6596/244/4/042028
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2019
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sg-nus-scholar.10635-1551512023-09-08T09:14:47Z XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 Rosmej, FB Galtier, E Riley, D Dzelzainis, T Heinmann, P Khattak, FY Lee, RW Nagler, B Nelson, A Tschentscher, T Vinko, SM Whitcher, T Toleikis, S F??ustlin, R Soberierski, R Juha, L Fajardo, M Wark, JS Chalupsky, J Hajkova, V Krzywinski, J Jurek, M Kozlova, M CENTRE FOR ADVANCED 2D MATERIALS 10.1088/1742-6596/244/4/042028 Journal of Physics: Conference Series 244 4 042028-042028 2019-06-04T03:57:16Z 2019-06-04T03:57:16Z 2010-08-01 2019-06-03T07:18:56Z Article Rosmej, FB, Galtier, E, Riley, D, Dzelzainis, T, Heinmann, P, Khattak, FY, Lee, RW, Nagler, B, Nelson, A, Tschentscher, T, Vinko, SM, Whitcher, T, Toleikis, S, F??ustlin, R, Soberierski, R, Juha, L, Fajardo, M, Wark, JS, Chalupsky, J, Hajkova, V, Krzywinski, J, Jurek, M, Kozlova, M (2010-08-01). XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2. Journal of Physics: Conference Series 244 (4) : 042028-042028. ScholarBank@NUS Repository. https://doi.org/10.1088/1742-6596/244/4/042028 1742-6596 https://scholarbank.nus.edu.sg/handle/10635/155151 IOP Publishing Elements |
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10.1088/1742-6596/244/4/042028 |
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CENTRE FOR ADVANCED 2D MATERIALS |
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CENTRE FOR ADVANCED 2D MATERIALS Rosmej, FB Galtier, E Riley, D Dzelzainis, T Heinmann, P Khattak, FY Lee, RW Nagler, B Nelson, A Tschentscher, T Vinko, SM Whitcher, T Toleikis, S F??ustlin, R Soberierski, R Juha, L Fajardo, M Wark, JS Chalupsky, J Hajkova, V Krzywinski, J Jurek, M Kozlova, M |
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Article |
| author |
Rosmej, FB Galtier, E Riley, D Dzelzainis, T Heinmann, P Khattak, FY Lee, RW Nagler, B Nelson, A Tschentscher, T Vinko, SM Whitcher, T Toleikis, S F??ustlin, R Soberierski, R Juha, L Fajardo, M Wark, JS Chalupsky, J Hajkova, V Krzywinski, J Jurek, M Kozlova, M |
| spellingShingle |
Rosmej, FB Galtier, E Riley, D Dzelzainis, T Heinmann, P Khattak, FY Lee, RW Nagler, B Nelson, A Tschentscher, T Vinko, SM Whitcher, T Toleikis, S F??ustlin, R Soberierski, R Juha, L Fajardo, M Wark, JS Chalupsky, J Hajkova, V Krzywinski, J Jurek, M Kozlova, M XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 |
| author_sort |
Rosmej, FB |
| title |
XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 |
| title_short |
XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 |
| title_full |
XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 |
| title_fullStr |
XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 |
| title_full_unstemmed |
XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2 |
| title_sort |
xuv emission from autoionizing hole states induced by intense xuv-fel at intensities up to 1017w/cm2 |
| publisher |
IOP Publishing |
| publishDate |
2019 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/155151 |
| _version_ |
1778169070666907648 |