XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2

by Rosmej, FB, Galtier, E, Riley, D, Dzelzainis, T, Heinmann, P, Khattak, FY, Lee, RW, Nagler, B, Nelson, A, Tschentscher, T, Vinko, SM, Whitcher, T, Toleikis, S, F??ustlin, R, Soberierski, R, Juha, L, Fajardo, M, Wark, JS, Chalupsky, J, Hajkova, V, Krzywinski, J, Jurek, M, Kozlova, M
Published 2019