Local current measurements for avalanche breakdown in Silicon p-n junctions

by Poenar, Daniel P., Ding, Y., Isakov, D. V.
Published 2013

Optical near-field probe with embedded gallium scattering center

by Isakov, D.V., Zhang, Y., Balk, L.J., Phang, J.C.H.
Published 2014

A general simulation procedure for the electrical characteristics of metal-insulator-semiconductor tunnel structures

by Vexler, M. I., Tyaginov, S. E., Illarionov, Yu. Yu., Sing, Yew Kwang., Shenp, Ang Diing., Fedorov, V. V., Isakov, D. V.
Published 2013

Applications of scanning near-field photon emission microscopy

by Isakov, D.V., Tan, B.W.M., Phang, J.C.H., Yeo, Y.C., Tio, A.A.B., Zhang, Y., Geinzer, T., Balk, L.J.
Published 2014