A mechanism of field-oxide-ungrowth phenomenon in recessed isolation process and practical solution

by Jang, S.-A., Kim, Y.-B., Cho, B.-J., Kim, J.-C.
Published 2014

Isolation process induced wafer warpage

by Jang, S.-A., Yeo, I.-S., Kim, Y.-B., Cho, B.-J., Lee, S.-K.
Published 2014

Isolation process induced wafer warpage

by Jang, S.-A., Yeo, I.-S., Kim, Y.-B., Cho, B.-J., Lee, S.-K.
Published 2014

Hydrogenation properties of Ni-Nb-Zr-Ta amorphous ribbons

by Jayalakshmi, S., Choi, Y.G., Kim, Y.C., Kim, Y.B., Fleury, E.
Published 2014

Wettability, structural and optical properties investigation of TiO2 nanotubular arrays

by Zalnezhad, E., Maleki, E., Banihashemian, S.M., Park, J.W., Kim, Y.B., Sarraf, M., Sarhan, Ahmed Aly Diaa Mohammed, Ramesh, Singh
Published 2016

Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure

by Yue, J.M.P., Chim, W.K., Cho, B.J., Chan, D.S.H., Qin, W.H., Kim, Y.-B., Jang, S.-A., Yeo, I.-S.
Published 2014

Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure

by Yue, J.M.P., Chim, W.K., Cho, B.J., Chan, D.S.H., Qin, W.H., Kim, Y.-B., Jang, S.-A., Yeo, I.-S.
Published 2014

Channel-width effect on hot-carrier degradation in NMOSFETs with recessed-LOCOS isolation structures

by Yue, J.M.P., Chim, W.K., Cho, B.J., Chan, D.S.H., Qin, W.H., Kim, Y.B., Jang, S.A., Yeo, I.S.
Published 2014

Suppression of mixed-phase areas in highly elongated BiFeO 3 thin films on NdAlO 3 substrates

by Woo, C.-S., Lee, J.H., Chu, K., Jang, B.-K., Kim, Y.-B., Koo, T.Y., Yang, P., Qi, Y., Chen, Z., Chen, L., Choi, H.C., Shim, J.H., Yang, C.-H.
Published 2014