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Lai, K.-K.
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Lai, K.-K.
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Lai, K.-K.
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Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devices
by
Lai
,
K
.-
K
.
,
Lim, P.-S.
,
Chim, W.-K.
,
Pan, Y.
Published 2014
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2
Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devices
by
Lai
,
K
.-
K
.
,
Lim, P.-S.
,
Chim, W.-K.
,
Pan, Y.
Published 2014
Get full text
Conference or Workshop Item
Save to List
Saved in:
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