Oxidation study of hydrogenated amorphous silicon carbide films

by Choi, W.K., Lee, L.P., Leoy, C.C.
Published 2014

Investigation on oxide growth mechanism of PECVD silicon carbide films

by Choi, W.K., Leoy, C.C., Lee, L.P.
Published 2014

X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films

by Leoy, C.C., Choi, W.K., Wong, K.L., Wong, K.M., Osipowicz, T., Rong, J.
Published 2011

Oxidation study of rf sputtered amorphous and polycrstalline silicon germanium films

by Leoy, C.C., Kan, E.W.H., Arianto, J., Choi, W.K., Wee, A.T.S., Liu, Y.J.
Published 2014

Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix

by Kan, E.W.H., Choi, W.K., Leoy, C.C., Chim, W.K., Antoniadis, D.A., Fitzgerald, E.A.
Published 2014