Modeling of electromigration failure under pulsed current conditions in confined copper interconnect

بواسطة Lin, Jingyuan.
منشور في 2010

Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress

بواسطة Lim, Meng Keong, Lin, Jingyuan, Ee, Elden Yong Chiang, Ng, Chee Mang, Wei, Jun, Gan, Chee Lip
منشور في 2013