COMPUTATION OF ELECTRON AND HOLE QUASI-FERMI LEVELS IN POLYCRYSTALLINE SILICON FILMS UNDER UNIFORM ILLUMINATION AND ZERO BIAS.

by Ling, Chung Ho
Published 2014

Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias

by Ang, Chew-Hoe, Ling, Chung-Ho, Cheng, Zhi-Yuan, Kim, Sun-Jung, Cho, Byung-Jin
Published 2014